We are into the business of producing and supplying the top quality range of Surface Roughness Tester which quantifies surface of metal and non-metal parts. Due to its little and smaller size, it can be transported easily and effortlessly anywhere. The computerized reasoning capacities naturally select the perfect cut off quality, measuring range and different conditions. It is easy to understand and bolsters extensive variety of styli alternatives.
- Top Flight Performance in Production•Best of class Straightness Accuracy 0.3um/50 mm
- Easy Change of Stylish
- 50 mm navigate length, worked in datum plane and substantial measuring range
- Wide Range of styli alternatives identifier
- Handy, minimal use
- Analysis parameters obliging overall prerequisites
- Selectable Amplifier LCD touch board
- Artificial Intelligence works consequently select the perfect cut off quality, measuring range and different conditions. This robotizes estimation.
- PC Card Slot-Measuring Conditions, Measured result administration or measured information can be yield in parallel and content configuration.
- Host of Analysis Functions-joins 34 sorts of unpleasantness and 32 waviness parameters.
- Tilt Correction Function: Six kind of programmed tilt adjustment are given.
- Evaluation Range Setting-The waveform on the screen is encased by two cursors, permitting the fancied extent to be set and the parameters to be figured.
Measuring Range: X Axis- 50mm, Z axis - 800µ mm (Measuring range resolution: 800µm/10nm, 80µm/1nm, 8 µm/0.1nm)
Straightness accuracy: 0.3µm/50mm
Standards: Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, and CNOMO.
Parameters: Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R ?a, R ?q, R ?a, R ?q, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R dc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR
Evaluation curves: Section profile curve, filtered waviness curve, filtered center line waviness curve, rolling circle waviness curve, rolling circle center line waviness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve
Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph
TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction
Magnification : Vertical (Z-axis)- 50-100K Auto, Horizontal (X-axis): 1-5K auto
Detector : Tip radius 2µm, material diamond
Special functions: Artificial Intelligence functions, step analysis, PC card
Standard Accessories: Standard specimen, Recording Paper, Touch Pen, Instruction Manual
806, T.C. Jaina Tower-I, District Centre, Janakpuri New Delhi Delhi India 91-11-25594270/25573986