The surface Roughness Tester manufactured, imported and supplied by us.is used to measure surface texture of steel and non-metal elements. The small and compact size makes it quite simply moveable. The artificial intelligence functions robotically opt for the best reduce off worth, measuring range and other stipulations. It's user friendly and helps vast range of styli options.
SURFCOM 130A make: ZEISS
- High Flight performance in creation
- Fine of sophistication Straightness Accuracy 0.3um/50 mm
- Convenient change of fashionable
- Large variety of styli options
- 50 mm traverse size, developed in datum airplane and huge measuring range detector
- Selectable Amplifier liquid crystal display touch panel
- Evaluation parameters catering to worldwide necessities
- Synthetic Intelligence services robotically decide on the perfect cut off price, measuring variety and different stipulations. This automates dimension.
- Host of evaluation capabilities- incorporates 34 forms of roughness and 32 waviness parameters.
- Tilt Correction perform: Six form of computerized tilt correction are provided.
- Evaluation range atmosphere- The waveform on the reveal is enclosed by two cursors, allowing the desired variety to be set and the parameters to be calculated.
- PC Card Slot- Measuring conditions, measured influence management or measured information can also be output in binary and text format.
- Measuring Range: X Axis- 50mm, Z axis - 800Âµ mm (Measuring range resolution: 800Âµm/10nm, 80Âµm/1nm, 8 Âµm/0.1nm)
- Straightness accuracy: 0.3Âµm/50mm
- Analysis items:
- Standards: Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, and CNOMO.
- Parameters: Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R ?a, R ?q, R ?a, R ?q, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R dc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR
- Evaluation curves: Section profile curve, filtered waviness curve, filtered center line waviness curve, rolling circle waviness curve, rolling circle center line waviness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve
- Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph
- TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction
- Magnification : Vertical (Z-axis)- 50-100K Auto, Horizontal (X-axis): 1-5K auto
- Detector : Tip radius 2Âµm, material diamond
- Special functions: Artificial Intelligence functions, step analysis, PC card
- Standard Accessories: Standard specimen, Recording Paper, Touch Pen, Instruction Manual
806, T.C. Jaina Tower-I, District Centre, Janakpuri, New Delhi, Delhi, 110058, India